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SPI Unveils F-Nip For Nip Width Analysis

Sensor Products Inc. (SPI), East Hanover, N.J., reports its F-Nip® Flying Dynamic Electronic Nip Analysis System is the first to allow real-time measurement of nip width while the rollers are rotating at jog speeds. The device detects crown deficiencies, inaccurate roll alignment and roller skewing all of which can cause defective product and other processing problems.

According to the company, F-Nip combines the advantages of Pressurex® tactile pressure measuring film with the real-time electronic analysis capability of SPI's E-Nip® system, enabling nip width to be measured while the sensor chain riding on the substrate passes through the nip.

July 2004




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