GRAND RAPIDS, Mich. — December 6, 2011 — X-Rite Incorporated is helping customers to streamline
their workflows with the next generation of its popular NetProfiler software that can verify,
optimize, and certify handheld and benchtop spectrophotometers used at locations worldwide on a
regular basis.
With the new NetProfiler 3.0, companies can calibrate spectrophotometers in design
departments, on factory floors and in test labs to a single virtual standard, ensuring that color
measurements taken at distant locations are accurate and reliable throughout the supply chain.
Over the past few years, X-Rite’s earlier version of NetProfiler has become the standard in
textiles, plastics, packaging and coatings industries to optimize the performance of benchtop
spectrophotometers that all experience some data drift over time due to age and use. NetProfiler
3.0 now extends the power of profiling to handheld devices with embedded profiling
capabilities.
“We are particularly excited about our new NetProfiler solutions for handheld
spectrophotometers, extending the benefits of profiling to new category of devices and customer
workflows.” said Richard Knapp, product manager for the software. He says all versions of
NetProfiler 3.0 have improved speed and stability on personal computers and can be run offline to
store profiles on portable USB memory sticks.
Another feature of NetProfiler 3.0 is its capability to profile new families of devices such
as sphere-based instruments like the Ci52 for industrial applications. For companies in the graphic
arts industry that use the SpectroEye spectrophotometer, NetProfiler 3.0 provides a profiling
solution for graphics arts workflow.
NetProfiler 3.0 can help customers by providing:
* confidential reports that detail instrument performance, compliance
status by location and instrument, relationships between color partners, and local auditing and
certification;
* ways to exchange comparative color data easily anywhere in the world
with business partners that may have various types of color-measurement instruments; and,
* new cost-effective ceramic calibration media providing equivalent
performance to BCRA-II tiles. With two formats optimized for benchtop or handheld
spectrophotometers, the new calibration media offers significantly improved spatial uniformity,
consistent targeting, and improved performance – particularly for smaller aperture devices.
The improved calibration media allows the number of color standards to be reduced, streamlining the
profiling process.
Posted on December 12, 2011
Source: X-Rite Inc.
